Sub-nm resolution depth profiling of the magnetic structure of thin films by the depth-resolved x-ray magnetic circular dichroism technique

Abstract

The principle and applications of the depth-resolved x-ray magnetic circular dichroism (XMCD) technique are demonstrated, by which depth profiling of the magnetic structure of thin films is achieved with sub-nm resolution. The formation of a NiO-like layer at the surface of a Ni/Cu(1 0 0) thin film is revealed by this technique. Moreover, a small uncompensated magnetic moment in the surface layer is suggested, which shows an antiparallel coupling to that in the inner Ni layers. Development of a three-dimensional XMCD technique is also demonstrated, in which an x-ray microbeam is combined with the depth-resolved XMCD. A preliminary study on the magnetic anisotropy of Fe/Ni/Cu(1 0 0) is shown using this new technique.