Abstract

<p>The fluorite ferroelectrics is extremely promising for memory applications due to the silicon compatibility and the robust ferroelectricity with decreasing size. However, the direct observation of local electronic polarization remains elusive, thereby hindering the comprehension of the atomic-scale origin of ferroelectricity. Here, we directly map the real-space charge density of the ZrO<sub>2</sub> nanocrystal in its polar, nonpolar, as well as interphase regions with sub-?ngstr?m resolution by four-dimensional scanning transmission electron microscopy (4D-STEM). Based on the variation of the electric dipole moments, we analyze the electronic contribution to the total spontaneous polarization, which reaches a maximum of 17.8%. In comparison to the continuous polarization in conventional ferroelectric units, the local polarization profile looks like a maple leaf edge at the tetragonal-orthorhombic phase interface, which suggests a gradual increase in the electronic polarization and the covalent nature of the Zr-O bond. We validate these findings with 4D-STEM simulations and calculations based on density functional theory. These findings provide atomic insights into the bonding nature and phase transition feature in fluorite oxides, and unravel the likely origin of ferroelectricity in ferroelectrics.</p>

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.