Abstract
Ferroelectric materials are characterized by the spontaneous polarization switchable by the applied fields, which can act as a “gate” to control various properties of ferroelectric/insulator interfaces. Here we review the recent studies on the modulation of oxide hetero-/homo-interfaces by ferroelectric polarization. We discuss the potential applications of recently developed four-dimensional scanning transmission electron microscopy and how it can provide insights into the fundamental understanding of ferroelectric polarization-induced phenomena and stimulate future computational studies. Finally, we give the outlook for the potentials, the challenges, and the opportunities for the contribution of materials computation to future progress in the area.
Highlights
Perovskite oxides have attracted extensive research interest due to their various adjustable order parameters and their mechanicalelectromagnetic coupling effects (Fig. 1)[1–4]
It is clear that the boundary conditions will strongly influence the interfacial properties of ferroelectric thin films and having highresolution characterization methods that can determine the local polarization and electronic properties at atomically sharp interfaces, such as STEM imaging, EELS, 4D-STEM, and SPM, will play an important role in fully characterizing these films
In order to keep up with the exponentially growing need for computing efficiency, nontraditional materials such as twodimensional materials and beyond-CMOS logic structures relying on multiple order parameters such as charge, spin, and lattice, have become plausible ways to significantly improve the energy efficiency and speed of integrated circuits
Summary
Perovskite oxides have attracted extensive research interest due to their various adjustable order parameters and their mechanicalelectromagnetic coupling effects (Fig. 1)[1–4]. DWs in ferroelectrics can be recognized as a type of homogeneous interface (Fig. 1), which are twodimensional boundaries separating two regions (domains) with different polarization orientations, resulting in particular functional characteristics[27]. If we look closer into these different types of interfaces mentioned above, we can find that the highly localized properties are related to the polarization structure in ferroelectric materials. In AC-STEM imaging, after the probe interacts with the sample and a convergent beam electron diffraction (CBED) pattern is projected onto annular detectors which generate different types of images depending on the scattering angle of the electrons. Several different types of secondary electrons, X rays, plasmons, and other excitations can be generated when
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