Direct non-destructive trace and major elemental analysis in steel samples utilizing micro-focused bremsstrahlung radiation in X-ray fluorescence geometry.

Abstract

Stainless steel is a very important technological material used in various industries. In this work, a simple non-destructive method is developed for major as well as trace elemental determination in stainless steel samples using micro-X-ray fluorescence (XRF) based technique. The utilization of full bremsstrahlung excitation in combination with micro-focused geometry substantially reduces the detection limit of different elements present in stainless steel. The developed methodology is capable of determining elemental concentrations down to 30-80ppm level in stainless steel matrix without any requirement of cumbersome dissolution or separation procedure. Elements such as Si, P, S and Co were determined simultaneously at trace level using the developed micro-XRF based technique. At the same time this technique is also capable of analyzing elements which are present at percentage levels. Till now there is no such report showing the capability of lab-XRF based non-destructive technique for the analysis of both major as well trace elements down to such low concentration level to the best of our knowledge. Moreover, the methodology involved is very simple and straight forward. The analytical results obtained were very much satisfactory with good accuracy and precision.