Abstract

Hybrid organic-inorganic halide perovskites have been proposed in many optoelectronic applications, but critical to their increasing functionality and utility is understanding and controlling carrier transport. Here, we use light-induced transient grating spectroscopy to probe directly carrier transport in polycrystalline methylammonium lead iodide perovskite thin films using a weakly perturbative and noncontact method. The data reveal intrinsic diffusion characteristics of the charge carriers in the material and agree well with a simulated model of charge transport in which grain boundaries act as barriers to carrier movement.

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