Abstract
AbstractImproving light‐trapping capabilities through surface microstructuring of transparent conductive oxides is a promising approach to enhance solar cell efficiency. This study focuses on treating fluorine‐doped tin oxide (FTO) thin films using four‐beam direct laser interference patterning (DLIP) to create dot‐like periodic surface microstructures. The surface analysis using scanning electron microscopy and confocal microscopy reveals the presence of a periodic square grid of microcraters with a spatial period of ≈700 nm and an average depth ranging between 4 and 18 nm. These structures enhance the dispersion of incoming light up to 1000% in the visible and NIR spectra. When integrated into metal halide perovskite solar cells, FTO films patterned using low fluence conditions lead to a notable increase in the power conversion efficiencies (PCEs) compared to those made using untreated FTO. Importantly, preliminary stability tests on devices based on patterned FTO substrates show significantly improved stability compared to those fabricated using reference unpatterned substrates. These findings demonstrate that a DLIP treatment of FTO substrates is a promising technique that can substantially enhance the efficiency and stability of perovskite photovoltaic devices.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.