Direct high-precision measurement of the effective optical path length of multi-pass cell with optical frequency domain reflectometer.

Abstract

Multi-pass cells (MPCs) are commonly used in trace-gas detection and weak spectrum measurement. It is essential to accomplish a high-precision measurement of MPCs' effective optical path length (EOPL). A direct high-precision measuring method of MPCs' EOPL with optical frequency domain reflectometer (OFDR) was reported and demonstrated in this paper. Several important parameters of a MPC, such as EOPL and base length, were derived with high-precision by identifying the complicated signal of OFDR. The MPC's EOPL was also verified with the prevailing absorbance method. The results showed that the MPC's EOPL measured by each of these two methods is highly consistent. However, the relative uncertainty with the OFDR dramatically decreased 2 orders of magnitude (about 0.0085%) than that with the absorbance method. It demonstrated that the OFDR method with fewer measurement links is more conducive to a direct measurement. The performances of beam spread and stray light in the White-cell were also evaluated with the method.