Diode laser degradation mechanisms: A review

Abstract

Reliability engineering, unfortunately, is not widely taught in university programs, and requires a wide range of different skills and knowledge that are often difficult to piece together. Here, we share an introduction to the basics of reliability engineering as it applies to the qualification of semiconductor lasers and fiber optic transceivers, as well as other optoelectronic devices and assemblies. In this chapter, we go through the process flow for qualifying optoelectronic devices for sale, as part of the new product development process. The chapter is organized in chronological order, starting from design, development of a reliability qualification plan, setting up reliability test capabilities, data collection and analysis, qualification report contents, and finally failure analysis. While specialized books cover individual elements such as reliability calculation, burn-in optimization, or failure analysis methods, this is the first wide-ranging summary of its kind to touch on the full range of activities required in the practice of reliability engineering relevant to optoelectronics. The best-known methods for solving common challenges and building a strong reliability test program are discussed.