Abstract
In this paper, the type-I magnetic contrast for studying domain structures in a scanning electron microscope (SEM) is reviewed. The application of digital image processing (DIP) system, which has become common in recent years, brings some new possibilities. Owing to this, it is now possible to perform detailed study of domain behavior in the cases of very low magnetic contrast and complicated domain patterns. The features of type-I magnetic contrast are illustrated by the examples of domain images at the (0 0 0 1) surface of cobalt monocrystals. The main advantages and limitations of the method are discussed in more detail.
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