Abstract
A digital image processing (DIP) system and its application for domain observation in cobalt monocrystals by the type-I magnetic contrast in a scanning electron microscope (SEM) is presented. The system capabilities shown include contrast enhancement, noise reduction, removal of tilted illumination and undesirable periodic patterns from the image, Fourier analysis and determination of the magnetic domain width. In particular, it is demonstrated for the first time that even as the SEM possesses a single secondary electron detector it is possible to obtain images with type-I magnetic contrast only (i.e. without topographic contrast), owing to combining image alignment with image subtraction. Other advantages of using DIP systems are also mentioned.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
