Abstract
We describe and analyze the experimental realization of a speckle interferometry scheme designed for measurement of the value of the shift of the object surface along the surface itself. In contrast to classical speckle interferometric schemes, we use a specially formed two-dimensional pattern of the random binary structure as a speckle structure. The pattern being illuminated by the white light is photographed with the use of a digital camera. Further processing of the information related to the Fourier transformation of the pictures registered and determination of the obtained fringe structure period is carried out in a PC.
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