Abstract
We describe and analyze the experimental realization of the speckle interferometry scheme designed to measure deformation of an object surface. It can be shifted along the surface itself as well as turned or inclined. In contrast to the classical speckle interferometric schemes, we use a specially formed two-dimensional pattern of random binary structure as a speckle structure. The pattern being illuminated by the white light is photographed with the use of a digital camera. Further processing of the information related to the Fourier transformation of the pictures registered and determination of the obtained fringe structure period is carried out in PC.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
