Abstract

This paper describes ongoing research and development of a means for reusing existing digital models and test vectors that reside in IEEE P1445 (Digital Test Interchange Format-DTIF) format for digital test programs that are currently hosted on obsolete and nonsupported automatic test equipment. Our approach promotes the rendering of DTIF products into VXIbus-compatible files that are interoperable across a wide variety of VXI testers, independent of instrument manufacturer.

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