Abstract
A microcontroller-based circuit known as a "digital IC tester" determines if an integrated circuit is in good operating order or not. Product testing is a costly and time-consuming procedure in industries. Testing is required before the system is fully operational to prevent mistakes and undesirable outcomes. Similar to this, in educational institutions, it is required to verify whether the IC is excellent or bad before doing experiments during practicals. Numerous minor IC flaws cause the system to operate erratically and generate incorrect outputs. Therefore, the purpose of this research is to use a PIC microcontroller to construct an IC tester that can test the majority of integrated circuits in the 74xx series logic gates. The main goal of this project is to simulate the features of a logic gate IC and use the truth table of that specific IC to verify the state of the gates in that IC. Several design philosophies were contrasted before one was ultimately put into practice. Following the successful completion of simulation and testing, they were combined to produce the final version.
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