Abstract
Recently, Sinder et al. (2019) have studied the re-oxidation kinetics of chemically reduced, nitrogen-doped TiO2. Based on results of their ambipolar diffusion analysis, in this Comment, the associated electric field distribution and its evolution are studied. Numerical as well as approximate analytical solutions are given. It is found that the electric field profile exhibits a step-like shape penetrating from the specimen surface up to the ambipolar diffusion front. The ambipolar diffusion front pattern and its formation is discussed with special consideration of the impact of the internal electric field on the fluxes of the charged defects which are composed of counteracting diffusion-induced and field-driven contributions.
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