Abstract
Abstract : A Monte Carlo method has been used to evaluate the magnitude of twice scattered x-rays in diffraction experiments. The quantitative effects of variations in the primary scattering distribution, the absorption coefficient, the scattering power of the atoms, the x-ray wavelength, the specimen thickness, the monochromator and slit configuration and of polarization corrections have been derived. These factors have various influences on the magnitude and angular distribution of the twice scattered radiation.
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