Abstract
AbstractA free computer program, called DiffMap, is presented for off-line evaluation of both phase maps and orientation maps from a large number of diffraction patterns recorded with a nearly parallel nano-beam scanned line-by-line over a rectangular area in a scanning transmission electron microscope (STEM). The program runs in the Windows operating system on IBM PC compatible computers. The patterns, which are recorded independently from this program by a CCD or CMOS camera or by a pixelated camera are in Tif format, serve as input to DiffMap. Many STEMs can collect such a four-dimensional electron diffraction (4D-ED) data sets by proper selection of microscope parameters, even if this fact is not over-emphasized in the operating manuals. These phase and orientation maps can complement usual compositional maps collected in the same STEM with energy dispersive x-ray spectrometers (EDS) to give a complete description of the crystalline phases. Application is exemplified on the (fcc, hcp and bcc) phases in a sample with 4 major components (Co, Cr, Fe, Ni).
Highlights
Based on invited lecture presented at the HSM 2021 Conference.Traditional electron microscopic imaging evaluates two-dimensional (2D) images recorded with different contrast mechanisms
Many scanning transmission electron microscope (STEM) can collect such a four-dimensional electron diffraction (4D-ED) data sets by proper selection of microscope parameters, even if this fact is not over-emphasized in the operating manuals
The present paper reports the development of a computer program for off-line evaluation of such 4D-ED data sets, recorded with nearly parallel electron beam in the STEM independently from this program
Summary
Based on invited lecture presented at the HSM 2021 Conference.Traditional electron microscopic imaging evaluates two-dimensional (2D) images recorded with different contrast mechanisms. ABSTRACT A free computer program, called DiffMap, is presented for off-line evaluation of both phase maps and orientation maps from a large number of diffraction patterns recorded with a nearly parallel nano-beam scanned line-by-line over a rectangular area in a scanning transmission electron microscope (STEM). The patterns, which are recorded independently from this program by a CCD or CMOS camera or by a pixelated camera are in Tif format, serve as input to DiffMap. Many STEMs can collect such a four-dimensional electron diffraction (4D-ED) data sets by proper selection of microscope parameters, even if this fact is not over-emphasized in the operating manuals.
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