Abstract

AbstractSolid‐state nanopore sensors, a type of resistive pulse sensing, achieve optimal signal‐to‐noise performance with a single nanopore. However, the processes involved in solid‐state nanopore fabrication and subsequent measurements frequently lead to the formation of multiple nanopores, posing a challenge for precise detection. To address this issue, here, a novel and expedient technique to verify the presence of a single nanopore on a chip is developed. The methodology includes measuring the nanopore's conductance in solutions of various salt conditions, followed by a comparison of these results against a theoretical conductance model. This comparison is instrumental in distinguishing between single and multiple nanopores. Additionally, the study delves into various factors that influence the conductance curve, such as deviations in pore shape from the standard circle and inconsistencies in pore diameter. This approach significantly enhances the practical application of low‐cost nanopore preparation techniques, particularly in scenarios like controlled breakdown nanopore fabrication, where the formation of multiple nanopores is a common concern.

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