Abstract
A detailed knowledge of the physical and magnetic microstructure is important if the properties of modern magnetic materials are to be understood and subsequently improved. Imaging techniques available using a STEM equipped with a segmented detector provide the required information in an efficient manner. Difference signals from opposite segments of an annular quadrant detector lead to maps of the in-plane component of magnetic induction whilst the sum signal from a central detector provides a perfectly registered standard bright field image. The resolution in both images is typically ∼ 10 nm. In this paper a description is given of the imaging configuration we have developed and of the extent to which contrast arising from magnetic and non-magnetic sources can be separated. The use of the technique is illustrated with examples of the analysis of the complex two-dimensional induction distribution around a cross-tie wall in a soft magnetic film and of domain structures in a Co/Pt multi layer film suitable for thermomagneto-optic recording.
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