Abstract
A new measuring method and analyzing procedure were proposed to determine the complex dielectric constant of materials with relatively high dielectric constant by a lumped impedance measurement using impedance analyzer. Samples used for the measurement were (Ba0.6Sr0.4)TiO3 (BST) and Ba(Zr0.25Ti0.75)O3 (BZT) ceramics. Micro planar electrodes were formed on the surface of samples by electron beam lithography followed by lift-off method. Complex admittances of these samples were measured up to 3 GHz at different temperatures. Electromagnetic simulations were performed for determining the relative dielectric constant and dielectric loss. The complex dielectric constant vs frequency curves of Ba(Zr0.25Ti0.75)O3 showed a broad dielectric relaxation, while that of (Ba0.6Sr0.4)TiO3 was almost flat up to 3 GHz on high-temperature side of T m at which dielectric constant shows maximum value. Dielectric dispersion properties were discussed from the viewpoint of diffuse phase transition in ferroelectrics.
Published Version
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