Abstract
Dynamic nonlinear dielectric response of pulsed laser deposited epitaxial thin films of chemically ordered perovskite PbSc0.5Nb0.5O3 was experimentally studied and analyzed. Films deposited at 925K exhibited relaxor-like behavior indicated by frequency dispersion of temperature of dielectric maxima Tm, maximum in third-order dynamic nonlinear permittivity ε3(T), and increase of scaled dynamic third-order nonlinear permittivity asc below Tm. With decreasing deposition temperature, relaxor behavior was suppressed. Results are discussed in terms of film microstructure and random field strength.
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