Abstract
In this paper, three compositions, namely: 8/70/30, 10/70/30 and 12/70/30 of Lanthanum modified PZT (PLZT) thin films have been prepared on ITO coated glass substrates by sol-gel spin coating technique. The X-Ray Diffraction studies of these films show the strong peaks corresponding to the perovskite structure of ferroelectric materials. The dielectric constant (ϵ r ) and dielectric loss (tanδ) are measured as a function of frequency and temperature. The saturation polarization (P S ), remanent polarization (P R ) and coercive field (E C ) of polarization-electric field hysteresis loop are presented for these films. The I-V characteristics have also been obtained.
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