Abstract
Electrical properties of electrostatic self-assembled (ESA) films were investigated using aconductive polymer and metal bar. These nanostructured polymeric films were fabricatedon gold-coated glass slides using the ESA method. The thicknesses of the films were inthe range 120–630 nm, and the films were obtained by depositing numbers ofbilayers of negatively charged Poly s-119 (PS-119) or heparin and positively chargedPoly(diallyldimethylammonium chloride) (PDDA). Measurement electrodes were fabricatedon the ESA films using conductive silver grease and a brass bar. Capacitancemeasurements were conducted to determine the dielectric constant of the ESA films overvarious temperature and frequency ranges at 1 mV and 15% relative humidity, whileelectric field breakdown tests were performed at 1000 Hz, 15% relative humidity andvarying temperatures and voltages. The test results showed that dielectric constantvalues were between 1.8 and 2.4 and breakdown field values were approximately9 kV mm−1. Based on the test results, it is concluded that this is a technique that might prove usefulin estimating the capacitance, dielectric constant and breakdown field values ofnanostructured ESA films.
Published Version
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