Dielectric and Phase Transitional Properties of Cs2MnI4

Abstract

Crystals of Cs2MnI4 were grown by Bridgman method and differential thermal analysis and dielectric constant measurements were performed. Three phase transition points 240 K, 211 K and about 105 K were confirmed, which agrees with results already reported by X-ray diffraction study. Judging from the similarity in the temperature dependence of dielectric constant, it seems that phase transitions at around 240 K and 211 K correspond to normal-incommensurate and incommensurate-commensurate (lock-in) transition points.