Abstract
The ion-polishing method is applied to the fabrication of Ni/Ti and Ni/Mn multilayers in combination with an Ar + ion-beam sputtering deposition. The influences of the ion-polishing time, the ion-acceleration energy and the incident angle of ions on the interface roughness between layers were investigated using a high-resolution transmission electron microscopy (TEM). The TEM result showed the remarkable decrease of the interface roughness of Ni/Ti and Ni/Mn multilayers by ion polishing. Ion-polished multilayer mirrors have shown high reflectivities in X-ray and neutron reflectometries. The half-length in the upstream side of the nickel guide tube, which was installed at the thermal beam hole of the JRR-3M at JAERI has been replaced by a supermirror guide tube with a critical angle of 2 θ cNi. The result showed a remarkable increase in the neutron intensity at the exit of the neutron guide tube.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
