Abstract
ABSTRACTThis paper reports development of a highly sensitive pulsed eddy current (PEC) instrument based on metal-oxide-semiconductor field-effect transistor (MOSFET) switching logic capable of driving high current with varying rise time for testing thick metallic materials. A high dynamic range 24-bit analogue-to-digital converter card is used to effectively differentiate PEC signals from flaw and flaw-free regions. A PEC probe having a cylindrical coil exciter and a giant magneto resistance sensor receiver is used. The developed PEC instrument and probe have reliably detected sub-surface flaws located at 6.0 mm below the surface of an 8.0 mm thick stainless steel plate with a signal-to-noise of 15 dB.
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