Abstract
Development of LPSO structure and in-plane ordering during annealing the Mg85Y9Zn ternary alloy sample at 673 K (400 °C) was examined by synchrotron radiation small-angle scattering/diffraction measurements. By examining the first diffraction peaks for 18R, 10H, and in-plane order spot, the growth kinetics of in-plane order domain and the transition from 10H into 18R were discussed. The domain growth of in-plane order was characterized by small domain with little correlation between neighboring segregation layers.
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