Abstract
High signal-to-background (S/B) ratio depth-resolved soft X-ray absorption spectroscopy (XAS) is achieved by an energy-selective detection of the fluorescence with a diffraction grating at different emission angles. We apply this technique to a Au/FeCo/BaTiO3 thin film, and selectively observe the Fe and Co Lα fluorescences. The S/B ratio for the Co L-edge depth-resolved XAS is then enhanced by nearly two orders of magnitude. We observe the spectra at different probing depths, and find from the layer-resolved analysis that ∼60% of bottom Co is oxidized. A significant improvement in the observation of the buried interface state is thus successfully demonstrated.
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