Nanometer-resolution depth-resolved measurement of florescence-yield soft x-ray absorption spectroscopy for FeCo thin film.

Abstract

We develop a fluorescence-yield depth-resolved soft x-ray absorption spectroscopy (XAS) technique, which is based on the principle that the probing depth is changed by the emission angle of the fluorescence soft x rays. Compared with the electron-yield depth-resolved XAS technique, which has been established in this decade, we can observe wider range in-depth XAS distribution up to several tens of nm. Applying this technique to a 30 ML (∼4.3 nm) FeCo thin film, we observe Fe L-edge XAS spectra at the probing depth of 0.3-6 nm and find that the film has 22 ML (∼3.1 nm) surface oxide layer while its inner layer shows metallic state. We thus successfully obtain nanometer-resolution depth-resolved XAS spectra and further expect that operando measurement under the electric and/or magnetic fields is possible.