Abstract
A fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy technique in the soft x-ray region, by which the x-ray absorption spectra are recorded without scanning the monochromator, has been developed. The wavelength-dispersed soft x rays, in which the wavelength (photon energy) continuously changes as a function of the position, illuminate the sample, and the emitted fluorescence soft x rays at each position are separately focused by an imaging optics onto each position at a soft x-ray detector. Ni L-edge x-ray absorption spectra for Ni and NiO thin films taken in the wavelength-dispersive mode are shown in order to demonstrate the validity of the technique. The development of the technique paves the way for a real-time observation of time-dependent processes, such as surface chemical reactions, with much higher gas pressure compared to the electron-yield mode, as well as under magnetic and electric fields.
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