Abstract
Reported here is the development and implementation of an integrated in situ magnetoelastic measurement setup with a MOKE magnetometer, repositionable electromagnet, and sample transfer/straining device. The former were used within a molecular beam epitaxial vacuum growth chamber. Consequently the magnetostriction constants for both Cr capped and uncapped Fe/GaAs(100) films were acquired without film oxidization occurring. Samples were bent in a four point bending geometry to produce a quantifiable tensile mechanical strain on the films during magnetoelastic measurements. In addition, a laser measurement system was developed to confirm the induced strain in the samples.
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