Abstract

The aim of this study is to develop an energy-binned photon-counting (EBPC) detector that enables us to provide energy information of x-rays with a reasonable count statistics. We used Al-pixel/CdTe/Pt semiconductor detectors, which had an active area of 8 mm×144 mm and consisted of 18 modules aligned linearly. The size of a CdTe detector module was 8 mm×8 mm and the thickness of the CdTe crystal was 1 mm. Each module consisted of 40×40 pixels and the pixel size was 200 μm×200 μm. We applied the bias voltage of −500 V to the Pt common electrode. The detector counted the number of x-ray photons with four different energy windows, and output four energy-binned images with pixel depths of 12, 12, 11 and 10 bits at a frame rate of 1200 Hz (300 Hz×4 energy bins). The basic performance of the detector was evaluated in several experiments. The results showed that the detector realized the photon counting rate of 0.4×10 6 counts/sec/pixel (10 7 counts/sec/mm 2), energy resolution 4.4% FWHM at 122 keV. The integral uniformity of the detector was about 1% and the differential uniformity was about 1%. In addition, the image quality was examined with a resolution chart and step-wedge phantoms made of aluminum and polymethyl methacrylate. And we compared the quality of an acquired image with that acquired with an energy integration detector. The results of these experiments showed that the developed detector had desirable intrinsic characteristics for x-ray photon counting imaging.

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