Abstract
In recent decades, advancements in material-scanning technologies have enabled detailed acquisition of microstructural data, yet direct integration of this data into simulation models remains challenging. This study develops a system that utilizes scanning electron microscope (SEM) micrographs to construct a 2D spatial map, which categorizes microstructural attributes. Employing the Marching Cubes algorithm, we create the contours and shapes of grain clusters based on consistent grey values, facilitating the precise generation of grain areas in simulation software. This generated model is then applied to simulate a uniaxial tensile test, revealing irregular principal stress distributions along grain boundaries and notable stress concentrations at void-grain interfaces. These results emphasize the system’s efficacy in providing precise material characterization, evaluation, and estimation. Additionally, the system accommodates further refinements, such as incorporating crystal orientations and conducting analyses like creep deformation and electrical property evaluation. Ultimately, this approach supports a comprehensive pipeline for material design, testing, analysis, and simulation, thereby enhancing the potential for targeted material improvements. Figure 1
Published Version
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