Development of a reliable probes in situ linear exchange module based on an environment control atomic force microscope.

Abstract

In this work, a reliable atomic force microscope (AFM) probes in situ linear exchange module based on a scanned-sample environment control AFM was developed. The reliability and functionality of the module were experimentally verified through surface topography scanning tests and wear tests under different conditions. The module is able to install up to three AFM probes simultaneously, and in situ exchange different AFM probes inside the chamber so that different measurements in the designated environments can be carried out continuously as required. Without opening the chamber and breaking the atmosphere, contaminants from outside can be effectively avoided, and unpredictable physical/chemical change of the sample can be prevented. The module can be potentially used as a critical tool in studying nanotribology.