Abstract
A new methodology of synchrotron powder diffraction with anomalous scattering for site occupancy determination has been examined. We have been developing a new Synchrotron powder diffraction geometry with focused X-ray beam, flat shape sample and area detectors. As an application of the geometry, a new methodology for site occupancy determination has been tried. The diffraction intensity ratio change against X-ray energy near an absorption edge was observed and was compared with the calculation obtained from various site distribution crystal structure models. The methodology has been successfully applied for site distribution determination of In atom in β-(Ga,In)2O3 crystal. The new methodology can obtain diffraction intensity without approximation in absorption correction and can eliminate preferred orientation effect. By the combination of these features the new methodology can be a new application of synchrotron powder diffraction with anomalous scattering.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
