Abstract

The FurnaSEM microfurnace was installed in the chamber of a scanning electron microscope to carry out in situ experiments at high temperatures and test its limits. The microfurnace was used in combination with different types of detectors (Everhart-Thornley for the collection of secondary electrons in a high vacuum, gas secondary electron detector for the specific collection of secondary electrons in the presence of gas, and Karmen© detector for the collection of backscattered electrons at high temperature). Experiments carried out on various samples (metal alloys and ceramics) show that the microfurnace operates in both high-vacuum and low-vacuum modes. Temperature ramp rates during temperature cycles applied to the sample range from 1 to 120 °C/min (temperature rise) and 1 to 480 °C/min (controlled and natural cooling). The maximum temperature at which images were recorded up to 25k × magnification was 1340 °C, with a residual air atmosphere of 120Pa. The choice of a flat furnace with the sample placed directly above it has enabled innovative experiments to be carried out, such as low-voltage imaging (using a shorter working distance-up to 10 mm-than is possible with conventional furnaces), 3D imaging (by tilting the stage by up to 10°), and high-temperature backscattered electron imaging (using a dedicated detector).

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