Abstract
Two different types of “Mossbauer camera” are presented in this review article. The first one uses an imaging technique for γ-rays which are converted to visual light by a Photon-counting Image Acquisition System (PIAS) combined with a Fiber Optic plate with CsI (Tl) Scintillator (FOS), while the second one is a mapping technique for γ-rays which are first focused by a Multi Capillary X-ray lens (MCX), and subsequently electrons and γ-rays are detected as function of the sample position by a micro-channel plate (MCP) and a Si-PIN detector, respectively. A mapping image of a silicon solar cell is shown as an example obtained by the latter system. We also report on the present status in developing a new combined lens for the mapping using a MCX and a Fresnel Zone Plate (FZP) in order to realize a submicron-meter spatial resolution in a laboratory.
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