Abstract

This paper proposes a high-speed deterministic digital technique to calibrate the errors due to capacitance mismatch and finite op-amp gain. Unlike other calibration techniques, this technique requires neither forcing the inputs of the intermediate stages being calibrated to exact voltages, nor reducing the gains of each stage to avoid saturation of output digital codes. A 1.5 bits/stage, 10 stages, 9 bits pipeline ADC with the three most significant stages calibrated is demonstrated in this paper. For a 10% mismatch in capacitances in the 3 MSB stages of the pipelined ADC, the calibration technique improved SNDR by more than 20 dB and SFDR by around 27 dB. The technique can also be slightly modified to calibrate algorithmic ADCs. For a 7% mismatch in capacitances of the algorithmic ADC, the proposed calibration technique improved SNDR by 18 dB and SFDR by around 28 dB.

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