Abstract
Cold-field emission properties of carbon cone nanotips (CCnTs) have been studied in situ in the transmission electron microscope (TEM). The current as a function of voltage, i(V), was measured and analyzed using the Fowler–Nordheim (F–N) equation. Off-axis electron holography was employed to map the electric field around the tip at the nanometer scale, and combined with finite element modeling, a quantitative value of the electric field has been obtained. For a tip-anode separation distance of 680nm (measured with TEM) and a field emission onset voltage of 80V, the local electric field was 2.55V/nm. With this knowledge together with recorded i(V) curves, a work function of 4.8±0.3 eV for the CCnT was extracted using the F–N equation.
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