Abstract

Thin film solar cells have, in general, three recombination locations that can limit the device performance – the bulk, front interface, and back interface. Unfortunately, it is difficult to determine which of these mechanisms limit any given device. Time resolved photoluminescence measurements provide an estimate for the carrier lifetime and, therefore, bulk recombination. Determining the role of the front and back interface in device performance, though, is more complicated. With this in mind, we investigated the use of current densityvoltage measurements with front and back illumination at varying intensities. Using numerical modeling, we show that recombination information about each interface can be gleaned, and the limiting interface can be determined. The response curve signatures learned from modeling are then applied to measurements of real devices.

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