Abstract
Various crystals are used for the dispersive components of X-ray spectrometers. The crystals are usually bent to meet the desired measurement needs, such as focusing. The bending can change the crystal diffraction properties, thus altering the spectrometer throughput and resolving power. This work concerns measuring the diffraction properties of a potassium acid phthalate (001) [KAP(001)] crystal bent into a circular cylinder segment. The measurement methods using a diode source and a synchrotron source are described. The multi-lamellar model for calculating the diffraction properties of a bent crystal is described. The measurement results are compared to the multi-lamellar model and show qualitative agreement. The measurements show how to make the multi-lamellar calculations a useful estimate. A method is given to make useful estimates of the diffraction properties of a KAP(001) crystal bent into a circular cylinder segment.
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