Determining heterogeneous slip activity on multiple slip systems from single crystal orientation pole figures

Abstract

A new experimental method to determine heterogeneity of shear strains associated with crystallographic slip in the bulk of ductile, crystalline materials is outlined. The method quantifies the time resolved evolution of misorientation within plastically deforming crystals using single crystal orientation pole figures (SCPFs) measured in-situ with X-ray diffraction. A multiplicative decomposition of the crystal kinematics is used to interpret the distributions of lattice plane orientation observed on the SCPFs in terms of heterogeneous slip activity (shear strains) on multiple slip systems. To show the method’s utility, the evolution of heterogeneous slip is quantified in a silicon single crystal plastically deformed at high temperature at multiple load steps, with slip activity in sub-volumes of the crystal analyzed simultaneously.