Abstract
The optical phase function F = 2 γ 1 − β 1 − β 2 of silver and manganese thin films, which is used as an upper component in a multiple-beam air/wedge at reflection, and is responsible for the formation of transmission-like fringes at reflection is determined. The dependence of such a redistribution on thickness has been investigated for Ag films ranging from 80 Å to 470 Å and for Mn films from 155 Å to 685 Å at a wavelength of 5461 Å. Two methods have been performed, the first is based on computing the intensity distribution for different values of F and Δ, and comparing it with the experimental microphotometer tracing. The second method is based on computing the phase at both l max and l min.
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