Abstract
We use the scanning SQUID microscope (SSM) to image the vortices in superconducting FeSe0.3Te0.7 (FST) thin films. The observed peak flux value of FST is nearly a quarter of that of an accompanying Nb film. We developed a method for quantitatively determining the London penetration depth of the FST film from the known value of Nb. The obtained value, 0.88 μm, is significantly larger than those obtained from single crystals of similar compositions by using other methods. The methodology developed for this study is useful for measuring London penetration depths of thin-film superconductors in general.
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