Abstract
Bi 12 GeO 20 and Bi12SiO20 single crystals have been grown from melts with different GeO2 and SiO2 contents, respectively, to investigate the influence of an intrinsic defect, the antisite defect (Bi on Ge or Si site), on the diffusion length and the mobility-lifetime product of excited charge carriers. Measurements of nonsteady-state photocurrents show that both quantities increase with decreasing concentration of the antisite defect.
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