Abstract
A method is presented allowing the determination of the three principal values (∈ 1 ,∈ 2 ,∈ 3 ) of the dielectric tensor for a chiral smectic-C liquid crystal in the case that the material has an uncompensated helix. Hence it is applicable for essentially all single substances and therefore suitable for developing correlations between molecular structure and dielectric properties of the smectic-C, materials. The method requires two samples and uses three different measurement geometries
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