Determination of refractive index profile of the planar waveguide by wedge technique and chemical sample preparation

Abstract

In this paper we will present determination of refractive index profile of an ion exchanged planar waveguide using wedge technique and chemical sample preparation. Several planar waveguides have been fabricated. We applied a chemical method to creating a wedge from a planar waveguide. The RIP was determined by inserting the sample in a Mach-Zehnder interferometer and applying fringe analysis methods.