Determination of particle-induced structural disorder depth profile in crystals using the grazing-angle incidence hard x-ray backscattering diffraction technique**This paper is dedicated to Professor Dr Petros H Bezirganyan on the occasion of his 95th birthday on 15th December 2011.

Abstract

In this theoretical paper, we propose an x-ray imaging method for determination of particle-induced structural disorder depth profile in the crystalline materials based on the extremely sensitive, high-resolution, and non-destructive grazing-angle incidence hard x-ray backscattering diffraction technique. A peculiar value of the Bragg angle is discovered within the specular beam suppression angular region for which the curve of x-ray reflectivity is very close to the profile of the corresponding structural disorder. The coincidence presents a unique opportunity for the direct registration of the structural disorder depth profile in particle-irradiated crystals.