Abstract
AbstractWave concept iterative procedure (WCIP) is used for the determination of scattering characteristics of single and double metallic ring frequency selective surfaces (FSS). In the WCIP method, the analysis of the FSS is reduced to that of the unit cell. Basically, the WCIP method consists of scattering the incident waves at the interface and the reflection of the scattered waves by the closing ends of the periodic wall box containing the FSS unit cell. The use of the two dimensional fast Fourier transform algorithm results in a reduction of the running time and memory space. FSSs based on single and double metallic rings are analyzed by the WCIP method. A good agreement is observed between the WCIP results and the experimental results. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 1324–1328, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23383
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