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Abstract
The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended from an ideal two-phase system to a pseudotwo-phase system with the presence of the interface layer, and a simpleaccurate solution is proposed to determine the average thickness of theinterface layer in porous materials. This method is tested by experimentalSAXS data, which were measured at 25 °C, of organo-modifiedmesoporous silica prepared by condensation of tetraethoxysilane (TEOS) andmethyltriethoxysilane (MTES) using non-ionic neutral surfactant as templateunder neutral condition.
Published Version
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